Weld-free mounting of lamellae for electrical biasing operando TEM
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Mounting FIB lamellae for in-TEM electrical biasing without ion-beam welding, an MM3E yields cleaner contacts and more reliable operando experiments.
This paper introduces a weld-free way to mount FIB-prepared lamellae for electrical-biasing operando TEM. By avoiding ion-beam-induced welding — which can contaminate contacts and damage the specimen — the method yields cleaner electrical connections and more reliable in-situ biasing experiments, with an MM3E micromanipulator performing the lamella transfer and mounting.
