2008Applied Physics Letters 93 183112

Accurate electrical testing of individual gold nanowires by in situ scanning electron microscope nanomanipulators

Yong Peng, Tony Cullis, Beverley Inkson

Highlight

Sheffield measured the true resistivity and failure current of single 55 nm gold nanowires — contacted directly by Kleindiek nanomanipulators inside the SEM.

Individual gold nanowires are contacted and electrically tested in situ in the SEM with Kleindiek nanomanipulators and a Keithley picoammeter. For 55 nm-wide, bamboo-grained gold nanowires the authors measure an intrinsic resistivity near 2.26 µΩ·cm and a remarkably high failure current density of 4.94 × 10⁸ A/cm², separating intrinsic conductivity from contact effects using resistance-versus-length data.

Get in touch

Talk to an application engineer

Tell us your sample and your microscope — we’ll walk you through the workflow and route you to the right regional team.