MM3A-EM

Two decades, one industry standard#

Refined for electron microscopy over more than twenty years, the MM3A-EM is the OEM and retrofit standard across SEM, FIB and combined instruments — with well over 3000 units in the field. Each unit passes a one-year endurance test before it ships, and in production use drift stays below 1 nm/min, so a probe placed at the start of a long acquisition is still where you left it at the end.

Give your microscope a hand: use the MM3A-EM to add new capabilities and functionality to your instrument.

No blind axis, no stage swap#

The spherical Nanomotor® mechanism folds coarse positioning and sub-nanometre fine motion into a single drive — 0.5 nm on axis A, 0.2 nm on B, 0.05 nm on C — with no backlash and no “blind axis” the way cartesian stages have. That geometry delivers 100 cm³ of working volume from a body that mounts on one M4 tapped hole, and its compact construction keeps resonance frequencies high, so the tip stays put under the beam.

A hub for the whole toolkit#

Swap probe tips by hand between samples, then attach any of seven Kleindiek plug-in tools — microgripper, rotational wrist, force-measurement system and more. Ready-made interfacing covers Zeiss, FEI, Hitachi and Jeol instruments, door to load-lock mounts. At the National University of Singapore, two MM3A-EMs isolated a single carbon nanotube from a bundle and bent it through several micronewtons of force without breaking it.