Fabrication of super-sharp nanowire atomic force microscope probes using a field emission induced growth technique
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A two-manipulator Kleindiek setup let NUS grow super-sharp tungsten-nanowire AFM tips reproducibly on cantilevers of differing stiffness.
This companion paper details a field-emission-induced growth technique for single metallic nanowires on AFM tips, using two MM3A-EM micromanipulators in an ESEM with a clamping arrangement. Tungsten nanowires were grown to between 100 nm and 1.5 µm with very small tip radii, on cantilevers of different force constants, with high consistency and reproducibility.
