High-resolution nanowire atomic force microscope probe grown by a field-emission induced process
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By a field-emission process, NUS grew vertical tungsten-nanowire AFM tips on demand, two MM3A manipulators positioning the tip and clamping even soft cantilevers inside an ESEM.
A field-emission-induced growth process grows vertically aligned tungsten-nanowire AFM probes whose length is set by the growth time. Two three-axis MM3A micromanipulators in a Philips XL-300 ESEM position the etched tungsten tips and clamp low-stiffness cantilevers, so the technique works even on soft probes. The resulting high-aspect-ratio tips give high-resolution tapping-mode imaging and better profiling of steep sidewalls.
